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キーワード:
15th International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 15), Gifu, 2002-05-26 to 2002-05-31
要旨:
Modeling of transient impurity transport during large ELMs is used to explore basic processes
which may determine ELM-averaged enrichment. The b2-Eirene code (solps4), used for DIII-D
geometry, suggests that a complex sequence can occur during an ELM cycle in which a transiently
detached phase, with relatively low enrichment, can occur even under nominally attached conditions.
A slower recovery phase then follows, in which the effect of induced scrape-off layer flows can
increase in importance. The model results are compared with available fast time-scale
measurements. The observed increased enrichment with higher Z is similar to trends in basic particle
reflection properties. Neon recycling processes may thus introduce a significant history effect, as
illustrated by analysis of continuous, unforced neon accumulation in a DIII-D discharge with a
well-characterized operational history.
