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  Tritium Depth Profiling in Carbon by Accelerator Mass Spectrometry

Friedrich, M., Pilz, W., Sun, G. Y., Behrisch, R., García-Rosales, C., Bekris, N., et al. (2000). Tritium Depth Profiling in Carbon by Accelerator Mass Spectrometry. Nuclear Instruments and Methods in Physics Research B, 161-163, 216-220. Retrieved from http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TJN-3YTT021-1W-P&_cdi=5315&_user=100196&_orig=browse&_coverDate=03%2F31%2F2000&_sk=998389999&view=c&wchp=dGLbVlb-zSkzV&md5=3eb0bada6b4b5177443727d8a196cbf9&ie=/sdarticle.pdf.

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 Creators:
Friedrich, M.1, Author
Pilz, W.1, Author
Sun, G. Y.1, Author
Behrisch, R.2, Author              
García-Rosales, C.3, Author
Bekris, N.1, Author
Penzhorn, R.-D.1, Author
Affiliations:
1Forschungszentrum Rossendorf, Institute of Ion Beam Physics and Materials Research, Postfach 510119, D-01314, Dresden, Germany; Forschungszentrum Karlsruhe, Tritium Laboratory, Karlsruhe, Germany, ou_persistent22              
2External Organizations, ou_persistent22              
3Max Planck Society, ou_persistent13              

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Language(s): eng - English
 Dates: 2000
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Nuclear Instruments and Methods in Physics Research B
Source Genre: Journal
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Pages: - Volume / Issue: 161-163 Sequence Number: - Start / End Page: 216 - 220 Identifier: ISSN: 0168-583X