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  Resonant charge transfer in low-energy ion scattering: Information depth in the reionization regime

Primetzhofer, D., Spitz, M., Taglauer, E., & Bauer, P. (2011). Resonant charge transfer in low-energy ion scattering: Information depth in the reionization regime. Surface Science, 605(21-22), 1913-1917. doi:10.1016/j.susc.2011.07.006.

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Primetzhofer, D.1, Author
Spitz, M.1, Author
Taglauer, E.2, 3, Author              
Bauer, P.4, Author              
Affiliations:
1Institut für Experimentalphysik, Johannes Kepler Universität Linz, A-4040 Linz, Austria, ou_persistent22              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              
4External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Surface Science
Source Genre: Journal
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Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 605 (21-22) Sequence Number: - Start / End Page: 1913 - 1917 Identifier: -