Resonant charge transfer in low-energy ion scattering: Information depth in the 
reionization regime

Primetzhofer, D.; Spitz, M.; Taglauer, E.; Bauer, P.

doi:10.1016/j.susc.2011.07.006

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Resonant charge transfer in low-energy ion scattering: Information depth in the reionization regime

Primetzhofer, D., Spitz, M., Taglauer, E., & Bauer, P. (2011). Resonant charge transfer in low-energy ion scattering: Information depth in the reionization regime. Surface Science, 605(21-22), 1913-1917. doi:10.1016/j.susc.2011.07.006.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-EC6E-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-EC6F-0

Genre: Journal Article

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Creators:
Primetzhofer, D.¹, Author
Spitz, M.¹, Author
Taglauer, E.^{2, 3}, Author
Bauer, P.⁴, Author

Affiliations:
1Institut für Experimentalphysik, Johannes Kepler Universität Linz, A-4040 Linz, Austria, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
4External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2011

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 571093
DOI: 10.1016/j.susc.2011.07.006
URI: http://dx.doi.org/10.1016/j.susc.2011.07.006

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Title: Surface Science

Source Genre: Journal

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Publ. Info: Elsevier B.V.

Pages: - Volume / Issue: 605 (21-22) Sequence Number: - Start / End Page: 1913 - 1917 Identifier: -