Locking of Tearing Modes by the Error Field

Xu, T.; Hu, Q.-M.; Hu, X.-W.; Yu, Q.-Q.

doi:10.1088/0256-307X/28/9/095202

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Locking of Tearing Modes by the Error Field

Xu, T., Hu, Q.-M., Hu, X.-W., & Yu, Q.-Q. (2011). Locking of Tearing Modes by the Error Field. Chinese Physics Letters, 28: 095202 (4pp). doi:10.1088/0256-307X/28/9/095202.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-ECA1-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-ECA2-B

Genre: Journal Article

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Creators:
Xu, T.¹, Author
Hu, Q.-M.¹, Author
Hu, X.-W.¹, Author
Yu, Q.-Q.², Author

Affiliations:
1J-TEXT Tokamak Laboratory, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, College of Electric and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, ou_persistent22
2Tokamak Theory (TOK), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856309

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Language(s): eng - English

Dates: Date issued: 2011

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 572242
DOI: 10.1088/0256-307X/28/9/095202
URI: http://dx.doi.org/10.1088/0256-307X/28/9/095202

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Title: Chinese Physics Letters

Source Genre: Journal

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Publ. Info: Chinese Physical Society and IOP Publishing

Pages: - Volume / Issue: 28 Sequence Number: 095202 (4pp) Start / End Page: - Identifier: -