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  High resolution scanning transmission electron microscopy (HR STEM) analysis of re-deposited layer on ASDEX Upgrade tile

Rasinski, M., Fortuna-Zalesna, E., Mayer, M., Neu, R., Plocinski, T., Lewandowska, M., et al. (2011). High resolution scanning transmission electron microscopy (HR STEM) analysis of re-deposited layer on ASDEX Upgrade tile. Fusion Engineering and Design, 86(9-11), 1753-1756. doi:10.1016/j.fusengdes.2011.02.085.

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 Creators:
Rasinski, M.1, 2, Author           
Fortuna-Zalesna, E.3, Author
Mayer, M.1, 2, Author           
Neu, R.2, 4, Author           
Plocinski, T.3, Author
Lewandowska, M.3, Author
Kurzydlowskia, K. J.3, Author
ASDEX Upgrade Team, Author  
Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
3Warsaw University of Technology, Faculty of Material Science and Engineering, Woloska 141, 02-507 Warsaw, Poland, ou_persistent22              
4Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856308              

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Free keywords: 26th Symposium on Fusion Technology (SOFT 2010), Porto, 2010-09-27 to 2010-10-01
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
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Title: Fusion Engineering and Design
Source Genre: Journal
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Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 86 (9-11) Sequence Number: - Start / End Page: 1753 - 1756 Identifier: -