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  Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET

Jachmich, S., Eich, T., Arnoux, G., Fundamenski, W., & JET EFDA Contributors (2009). Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET. In M. Mateev, & E. Benova (Eds.), 36th European Physical Society Conference on Plasma Physics. Contributed Papers. Geneva: European Physical Society.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-FAE2-C Version Permalink: https://hdl.handle.net/21.11116/0000-000A-2CFD-9
Genre: Conference Paper

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 Creators:
Jachmich, S.1, Author
Eich, T.2, Author           
Arnoux, G.1, Author
Fundamenski, W.1, Author
JET EFDA Contributors, Author              
Affiliations:
1JET-EFDA, Culham Science Centre, Abingdon, OX14 3 DB, UK; Laboratory for Plasma Physics, Ecole Royale Militaire/Koninklijke Militaire School, EURATOM-Association "Belgian State", Brussels, Belgium, Partner in the Trilateral Euregio Cluster (TEC); EURATOM-UKAEA Fusion Association, Culham Science Centre, United Kingdom, ou_persistent22              
2Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856308              

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 437502
 Degree: -

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Title: 36th EPS Conference on Plasma Physics
Place of Event: Sofia
Start-/End Date: 2009-06-29 - 2009-07-03

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Title: 36th European Physical Society Conference on Plasma Physics. Contributed Papers
Source Genre: Proceedings
 Creator(s):
Mateev, M., Editor
Benova, E., Editor
Affiliations:
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Publ. Info: Geneva : European Physical Society
Pages: CD-ROM Volume / Issue: - Sequence Number: P-2.159 Start / End Page: - Identifier: ISBN: 2-914771-61-4

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Title: ECA
Source Genre: Series
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Pages: - Volume / Issue: 33E Sequence Number: P-2.159 Start / End Page: - Identifier: -