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  Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS

Adelhelm, C., Balden, M., Kost, F., Herrmann, A., & Lindig, S. (2008). Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS. Journal of Physics: Conference Series, 100(6): 062033 (4pp). doi:10.1088/1742-6596/100/6/062033.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-FE2D-2 Version Permalink: https://hdl.handle.net/21.11116/0000-0010-213A-8
Genre: Journal Article

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 Creators:
Adelhelm, C.1, Author           
Balden, M.1, Author                 
Kost, F.1, Author           
Herrmann, A.2, Author           
Lindig, S.1, Author           
Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              
2Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321              

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Free keywords: 17th International Vacuum Congress (IVC-17), 13th International Conference on Surface Science (ICSS-13) and International Conference on Nanoscience and Technology (ICN+T 2007), Stockholm, 2007-07-02 to 2007-07-06
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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 319405
URI: http://dx.doi.org/10.1088/1742-6596/100/6/062033
DOI: 10.1088/1742-6596/100/6/062033
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Title: Journal of Physics: Conference Series
Source Genre: Journal
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Pages: - Volume / Issue: 100 (6) Sequence Number: 062033 (4pp) Start / End Page: - Identifier: -