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  Depth of origin of sputtered atoms: Exploring the dependence on relevant target properties to identify the correlation with low-energy ranges

Wittmaack, K., & Mutzke, A. (2012). Depth of origin of sputtered atoms: Exploring the dependence on relevant target properties to identify the correlation with low-energy ranges. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 281, 37-44. doi:10.1016/j.nimb.2012.03.028.

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Wittmaack, K.1, Author
Mutzke, A.2, Author           
Affiliations:
1Helmholtz Zentrum München, Institut für Strahlenschutz, D-85758 Neuherberg, Germany, ou_persistent22              
2Stellarator Theory (ST), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856287              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
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Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 281 Sequence Number: - Start / End Page: 37 - 44 Identifier: -