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  Rutherford backscattering analysis of porous thin TiO2 films

Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., et al. (2012). Rutherford backscattering analysis of porous thin TiO2 films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273, 83-87. doi:10.1016/j.nimb.2011.07.045.

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 Creators:
Mayer, M.1, Author           
von Toussaint, U.1, Author           
Dewalque, J.2, Author
Dubreuil, O.2, Author
Henrist, C.2, Author
Cloots, R.2, Author
Mathis, F.2, Author
Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
2University of Liege, Department of Chemistry, GreenMat-LCIS, B6a Sart Tilman, 3 Allée de la Chimie, 4000 Liège, Belgium; University of Liege – FNRS, Centre Européen d’Archéométrie – IPNAS, B5, Sart Tilman, 10 Allée du 6 aout, 4000 Liège, Belgium, ou_persistent22              

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Free keywords: 20th International , Itapema, SC, 2011-04-10 to 2011-04-15
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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
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 Rev. Type: Peer
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
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Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 273 Sequence Number: - Start / End Page: 83 - 87 Identifier: -