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  Statistically sound evaluation of trace element depth profiles by ion beam analysis

Schmid, K., & von Toussaint, U. (2012). Statistically sound evaluation of trace element depth profiles by ion beam analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 281, 64-71. doi:10.1016/j.nimb.2012.03.024.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-E571-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0026-E572-D
Genre: Journal Article

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 Creators:
Schmid, K.1, Author           
von Toussaint, U.1, Author           
Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 609614
DOI: 10.1016/j.nimb.2012.03.024
URI: http://dx.doi.org/10.1016/j.nimb.2012.03.024
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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
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Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: 281 Sequence Number: - Start / End Page: 64 - 71 Identifier: -