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  Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography

Stoffers, A., Cojocaru-Mirédin, O., Seifert, W., Zaefferer, S., Riepe, S., & Raabe, D. (2015). Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications, 23(12), 1742-1753. doi:10.1002/pip.2614.

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 Creators:
Stoffers, Andreas1, Author           
Cojocaru-Mirédin, Oana1, Author           
Seifert, Winfried2, Author           
Zaefferer, Stefan3, Author           
Riepe, Stephan4, Author           
Raabe, Dierk5, Author           
Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387              
2Brandenburgische Technische Universität, Platz der Deutschen Einheit 1, Cottbus, Germany, ou_persistent22              
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
4Fraunhofer-Institut für Solare Energiesysteme, Freiburg, Germany, ou_persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015-05-082015-12
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1002/pip.2614
 Degree: -

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Title: Progress in Photovoltaics: Research and Applications
  Abbreviation : Prog. Photovoltaics: Res. Appl.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Chichester, West Sussex, England : John Wiley & Sons, Ltd.
Pages: - Volume / Issue: 23 (12) Sequence Number: - Start / End Page: 1742 - 1753 Identifier: ISSN: 1062-7995
CoNE: https://pure.mpg.de/cone/journals/resource/954925598626