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  Dependence of energy distributions of sputtered and reflected atoms on incident fluence

Eckstein, W., Dohmen, R., Friedrich, H., & Hertweck, F. (1999). Dependence of energy distributions of sputtered and reflected atoms on incident fluence. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 153(1-4), 345-349. doi:10.1016/S0168-583X(98)01016-7.

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 Creators:
Eckstein, W.1, Author           
Dohmen, R.2, Author           
Friedrich, H.3, Author           
Hertweck, F.3, Author           
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2Computer Center Garching (RZG), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856297              
3External Organizations, ou_persistent22              

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Free keywords: 4th International Conference on Computer Simulation of Radiation Effects in Solids (COSIRES 98), Okayama, 1998-09-15 to 1998-09-19
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Language(s): eng - English
 Dates: 1999
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 153 (1-4) Sequence Number: - Start / End Page: 345 - 349 Identifier: -