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  Angular dependence of the sputtering yield of rough beryllium surfaces

Küstner, M., Eckstein, W., Hechtl, E., & Roth, J. (1999). Angular dependence of the sputtering yield of rough beryllium surfaces. Journal of Nuclear Materials, 265(1-2), 22-27. doi:10.1016/S0022-3115(98)00648-5.

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 Creators:
Küstner, M.1, Author           
Eckstein, W.2, Author           
Hechtl, E.3, Author
Roth, J.2, 4, Author           
Affiliations:
1External Organizations, ou_persistent22              
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
3Technische Universität, Lichtenbergstr.4, D-85747 Garching, bei München, Germany, ou_persistent22              
4Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              

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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
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Title: Journal of Nuclear Materials
Source Genre: Journal
 Creator(s):
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Pages: - Volume / Issue: 265 (1-2) Sequence Number: - Start / End Page: 22 - 27 Identifier: -