Characterization of the temperature dependent phase transition of evaporated Ti 
films on diamond: Phase identification using maximum entropy data analysis

Miller, S.; Fischer, R.; Plank, H.; Roth, J.; Dose, V.

doi:10.1063/1.365640

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Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis

Miller, S., Fischer, R., Plank, H., Roth, J., & Dose, V. (1997). Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis. Journal of Applied Physics, 82, 3314-3320. doi:10.1063/1.365640.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-898D-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-898E-8

Genre: Journal Article

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Creators:
Miller, S.¹, Author
Fischer, R.¹, Author
Plank, H.¹, Author
Roth, J.¹, Author
Dose, V.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Language(s): eng - English

Dates: Date issued: 1997

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 233783
DOI: 10.1063/1.365640

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Title: Journal of Applied Physics

Alternative Title : J. Appl. Phys.

Source Genre: Journal

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Pages: - Volume / Issue: 82 Sequence Number: - Start / End Page: 3314 - 3320 Identifier: -