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  Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis

Miller, S., Fischer, R., Plank, H., Roth, J., & Dose, V. (1997). Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis. Journal of Applied Physics, 82, 3314-3320. doi:10.1063/1.365640.

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 Creators:
Miller, S.1, Author              
Fischer, R.1, Author              
Plank, H.1, Author              
Roth, J.1, Author              
Dose, V.1, Author              
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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Language(s): eng - English
 Dates: 1997
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 233783
DOI: 10.1063/1.365640
 Degree: -

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Title: Journal of Applied Physics
  Alternative Title : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 82 Sequence Number: - Start / End Page: 3314 - 3320 Identifier: -