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  Characterization of new semiconductor detectors for x-ray tomography in the ASDEX Upgrade Tokamak and its generalized physics interpretations

Cho, T., Hirata, M., Kohagura, J., Kanke, S., Takahashi, K., Sakamoto, Y., et al. (1997). Characterization of new semiconductor detectors for x-ray tomography in the ASDEX Upgrade Tokamak and its generalized physics interpretations. Review of Scientific Instruments, 68(1), 774-777. doi:10.1063/1.1147913.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8A5B-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8A5C-0
Genre: Journal Article

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 Creators:
Cho, T., Author
Hirata, M., Author
Kohagura, J., Author
Kanke, S., Author
Takahashi, K., Author
Sakamoto, Y., Author
Okamura, T., Author
Yatsu, K., Author
Tamano, T., Author
Hirano, K., Author
Maezawa, H., Author
Tanaka, S., Author
Bessenrodt Weberpals, M.1, Author
Affiliations:
1Max Planck Society, ou_persistent13              

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Free keywords: 11th Topical Conference on High-Temperature Plasma Diagnostics, Monterey (CA), 1996-05-12 to 1996-05-16
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Language(s): eng - English
 Dates: 1997
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 625213
DOI: 10.1063/1.1147913
URI: http://rsi.aip.org/resource/1/rsinak/v68/i1/p774_s1
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Title: Review of Scientific Instruments
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: Part 2 Volume / Issue: 68 (1) Sequence Number: - Start / End Page: 774 - 777 Identifier: -