Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces

Taglauer, E.; Reiter, S.; Liegl, A.; Schömann, S.

doi:10.1016/0168-583X(95)01099-8

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Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces

Taglauer, E., Reiter, S., Liegl, A., & Schömann, S. (1996). Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118(1-4), 456-461. doi:10.1016/0168-583X(95)01099-8.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8CF2-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8CF3-A

Genre: Journal Article

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Creators:
Taglauer, E.¹, Author
Reiter, S.¹, Author
Liegl, A.², Author
Schömann, S.³, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2Max Planck Society, ou_persistent13
3External Organizations, ou_persistent22

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Free keywords: 12th International Conference on Ion Beam Analysis (IBA-12), Arizona, 1995-05-22 to 1995-05-26

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 626313
DOI: 10.1016/0168-583X(95)01099-8
URI: http://www.sciencedirect.com/science/article/pii/0168583X95010998

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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Source Genre: Journal

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Pages: - Volume / Issue: 118 (1-4) Sequence Number: - Start / End Page: 456 - 461 Identifier: -