Investigations on calibration sources for soft-x-ray plasma spectroscopy and 
impurity monitors

Schumacher, U.; Asmussen, K.; Fussmann, G.; Liebsch, T.; Neu, R.

doi:10.1063/1.1147112

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Investigations on calibration sources for soft-x-ray plasma spectroscopy and impurity monitors

Schumacher, U., Asmussen, K., Fussmann, G., Liebsch, T., & Neu, R. (1996). Investigations on calibration sources for soft-x-ray plasma spectroscopy and impurity monitors. Review of Scientific Instruments, 67(8), 2826-2830. doi:10.1063/1.1147112.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8D04-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8D05-9

Genre: Journal Article

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Creators:
Schumacher, U.¹, Author
Asmussen, K.², Author
Fussmann, G.³, Author
Liebsch, T.⁴, Author
Neu, R.², Author

Affiliations:
1External Organizations, ou_persistent22
2Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856293
3Plasma Diagnostics Group (HUB), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856324
4Max Planck Society, ou_persistent13

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 626326
DOI: 10.1063/1.1147112
URI: http://rsi.aip.org/resource/1/rsinak/v67/i8/p2826_s1

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 67 (8) Sequence Number: - Start / End Page: 2826 - 2830 Identifier: -