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  Simultaneous analysis of low-Z impurities in the near-surface region of solid materials by heavy ion elastic recoil detection (HIERD)

Grigull, S., Behrisch, R., Kreissig, U., & Harz, M. (1995). Simultaneous analysis of low-Z impurities in the near-surface region of solid materials by heavy ion elastic recoil detection (HIERD). Fresenius Journal of Analytical Chemistry, 353(5-8), 578-581. doi:10.1007/BF00321327.

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 Creators:
Grigull, S.1, Author              
Behrisch, R.1, Author              
Kreissig, U., Author
Harz, M., Author
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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Free keywords: 8th Conference on Applied Surface Analysis, Kaiserslautern, Germany, 1994-09-05 to 1994-09-08
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Language(s): eng - English
 Dates: 1995
 Publication Status: Published in print
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 Rev. Type: Peer
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Title: Fresenius Journal of Analytical Chemistry
Source Genre: Journal
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Pages: - Volume / Issue: 353 (5-8) Sequence Number: - Start / End Page: 578 - 581 Identifier: -