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  A New Approach to Internal Disruption Analysis with the Five-Camera Soft-x-Ray Diagnostic on RTP

Tanzi, C. P., De Blank, H. J., & Donne, A. J. H. (1995). A New Approach to Internal Disruption Analysis with the Five-Camera Soft-x-Ray Diagnostic on RTP. Review of Scientific Instruments, 66(No 1, Part 2), 537-539.

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 Creators:
Tanzi, C. P., Author
De Blank, H. J.1, Author           
Donne, A. J. H., Author
Affiliations:
1Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856295              

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Language(s): eng - English
 Dates: 1995
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 635178
 Degree: -

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Title: Review of Scientific Instruments
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 66 (No 1, Part 2) Sequence Number: - Start / End Page: 537 - 539 Identifier: -