A New Approach to Internal Disruption Analysis with the Five-Camera Soft-x-Ray 
Diagnostic on RTP

Tanzi, C. P.; De Blank, H. J.; Donne, A. J. H.

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A New Approach to Internal Disruption Analysis with the Five-Camera Soft-x-Ray Diagnostic on RTP

Tanzi, C. P., De Blank, H. J., & Donne, A. J. H. (1995). A New Approach to Internal Disruption Analysis with the Five-Camera Soft-x-Ray Diagnostic on RTP. Review of Scientific Instruments, 66(No 1, Part 2), 537-539.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8FA9-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8FAA-B

Genre: Journal Article

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Creators:
Tanzi, C. P., Author
De Blank, H. J.¹, Author
Donne, A. J. H., Author

Affiliations:
1Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856295

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Language(s): eng - English

Dates: Date issued: 1995

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 635178

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 66 (No 1, Part 2) Sequence Number: - Start / End Page: 537 - 539 Identifier: -