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  Depth Profiling of Deuterium in a Beryllium/Carbon Layer

Hughes, I. G., Behrisch, R., & Martinelli, A. P. (1992). Depth Profiling of Deuterium in a Beryllium/Carbon Layer. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, B64, 434-438.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-960C-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-960D-0
Genre: Journal Article

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 Creators:
Hughes, I. G., Author
Behrisch, R.1, Author              
Martinelli, A. P.1, 2, Author              
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292              

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Free keywords: 10th International Conference on Ion Beam Analysis, Eindhoven, 1991-07-01 to 1991-07-05
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Language(s): eng - English
 Dates: 1992
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 670187
 Degree: -

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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Elsevier B.V.
Pages: - Volume / Issue: B64 Sequence Number: - Start / End Page: 434 - 438 Identifier: -