Compact Cs+ Ion Microsource

Liebl, H.; Senftinger, P.; Staib, P.; Weiss, H.

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Compact Cs+ Ion Microsource

Liebl, H., Senftinger, P., Staib, P., & Weiss, H. (1990). Compact Cs+ Ion Microsource. In A. Benninghoven (Ed.), Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry (pp. 883-886). Chichester: Wiley.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-9BCD-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-9BCE-7

Genre: Conference Paper

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Creators:
Liebl, H.¹, Author
Senftinger, P.², Author
Staib, P.², Author
Weiss, H., Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2Max Planck Society, ou_persistent13

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Language(s): eng - English

Dates: Date issued: 1990

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Internal

Identifiers: eDoc: 630834

Degree: -

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Title: 7th Secondary Ion Mass Spectrometry (SIMDVII)

Place of Event: Monterey, CA (US)

Start-/End Date: 1989-09-03 - 1989-09-08

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Title: Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry

Source Genre: Proceedings

Creator(s):
Benninghoven, A., Editor

Affiliations:
-

Publ. Info: Chichester : Wiley

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 883 - 886 Identifier: -