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Zusammenfassung:
This paper studies mixture modeling using the Elliptical Gamma distribution (EGD)---a distribution that has parametrized tail and peak behaviors and offers richer modeling power than the multivariate Gaussian. First, we study maximum likelihood (ML) parameter estimation for a single EGD, a task that involves nontrivial conic optimization problems. We solve these problems by developing globally convergent fixed-point methods for them. Next, we consider fitting mixtures of EGDs, for which we first derive a closed-form expression for the KL-divergence between two EGDs and then use it in a ''split-and-merge'' expectation maximization algorithm. We demonstrate the ability of our proposed mixture modelling in modelling natural image patches.