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  Nanostructure analysis of complex materials using two-dimensional small angle X-ray scattering

Jakob, H., Erlacher, K., & Fratzl, P. (2003). Nanostructure analysis of complex materials using two-dimensional small angle X-ray scattering. In Materials Science, Testing and Informatics I (pp. 411-418).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-AD22-B Version Permalink: http://hdl.handle.net/21.11116/0000-0004-4196-9
Genre: Conference Paper

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 Creators:
Jakob, HF1, Author
Erlacher, K1, Author
Fratzl, P.2, Author              
Affiliations:
1external, ou_persistent22              
2External Organizations, ou_persistent22              

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Free keywords: Konferenzband
 Abstract: -

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 Dates: 2003
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
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Title: 3rd Hungarian Conference and Exhibition on Matrerials Science, Testing and Informatics
Place of Event: BALATONFURED, HUNGARY
Start-/End Date: 2001-10-14 - 2001-10-17

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Title: Materials Science, Testing and Informatics I
Source Genre: Proceedings
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Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 411 - 418 Identifier: ISSN: 0255-5476
ISBN: 0-87849-908-3

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Title: Materials Science Forum
Source Genre: Series
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Pages: - Volume / Issue: 414-415 Sequence Number: - Start / End Page: - Identifier: ISSN: 0255-5476