English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Temperature induced faceted hole formation in epitaxial Al thin films on sapphire

Hieke, S. W., Dehm, G., & Scheu, C. (2015). Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Talk presented at Understanding Grain Boundary Migration: Theory Meets Experiment. Günzburg/Donau, Germany. 2015-06-21 - 2015-06-24.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0027-C3AC-A Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6D59-2
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Hieke, Stefan Werner1, 2, Author              
Dehm, Gerhard3, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

Content

show
hide
Free keywords: Speaker: Dehm, G.
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2015-06
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: Understanding Grain Boundary Migration: Theory Meets Experiment
Place of Event: Günzburg/Donau, Germany
Start-/End Date: 2015-06-21 - 2015-06-24

Legal Case

show

Project information

show

Source

show