Temperature induced faceted hole formation in epitaxial Al thin films on 
sapphire

Hieke, Stefan Werner; Dehm, Gerhard; Scheu, Christina

Local TagsRelease HistoryDetailsSummary

Temperature induced faceted hole formation in epitaxial Al thin films on sapphire

Hieke, S. W., Dehm, G., & Scheu, C. (2015). Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Talk presented at Understanding Grain Boundary Migration: Theory Meets Experiment. Günzburg/Donau, Germany. 2015-06-21 - 2015-06-24.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-C3AC-A Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6D59-2

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hieke, Stefan Werner^{1, 2}, Author
Dehm, Gerhard³, Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

Content

show

hide

Free keywords: Speaker: Dehm, G.

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Created: 2015-06

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: Understanding Grain Boundary Migration: Theory Meets Experiment

Place of Event: Günzburg/Donau, Germany

Start-/End Date: 2015-06-21 - 2015-06-24

Legal Case

show

Project information

show

Source

show