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  PeerReview: practical accountability for distributed systems

Haeberlen, A., Kuznetsov, P., & Druschel, P. (2007). PeerReview: practical accountability for distributed systems. In SOSP’07: proceedings of the 21st ACM Symposium on (pp. 175-188). New York, NY: ACM.

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 Creators:
Haeberlen, Andreas1, Author              
Kuznetsov, Petr2, Author
Druschel, Peter1, Author              
Affiliations:
1Group P. Druschel, Max Planck Institute for Software Systems, Max Planck Society, ou_2105287              
2Max Planck Society, ou_persistent13              

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 Abstract: We describe PeerReview, a system that provides accountability in distributed systems. PeerReview ensures that Byzantine faults whose effects are observed by a correct node are eventually detected and irrefutably linked to a faulty node. At the same time, PeerReview ensures that a correct node can always defend itself against false accusations. These guarantees are particularly important for systems that span multiple administrative domains, which may not trust each other. PeerReview works by maintaining a secure record of the messages sent and received by each node. The record is used to automatically detect when a node's behavior deviates from that of a given reference implementation, thus exposing faulty nodes. PeerReview is widely applicable: it only requires that a correct node's actions are deterministic, that nodes can sign messages, and that each node is periodically checked by a correct node. We demonstrate that PeerReview is practical by applying it to three different types of distributed systems: a network filesystem, a peer-to-peer system, and an overlay multicast system.

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Language(s): eng - English
 Dates: 2008-03-282007
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 352586
Other: C125718C00511B58-84A2A943C77B87ADC12573AF00483D55-haeberlen-2007-peerreview
DOI: 10.1145/1294261.1294279
 Degree: -

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Title: SOSP’07 : proceedings of the 21st ACM Symposium on
Source Genre: Proceedings
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Publ. Info: New York, NY : ACM
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 175 - 188 Identifier: ISBN: 978-1-59593-591-5