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  Temperature induced faceted hole formation in epitaxial Al thin films on sapphire

Hieke, S. W., Dehm, G., & Scheu, C. (2015). Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Poster presented at 8th International Conference on High Temperature Capillarity (HTC-2015), Bad Herrenalb, Germany.

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 Creators:
Hieke, Stefan Werner1, Author           
Dehm, Gerhard2, Author           
Scheu, Christina1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2015-05
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 8th International Conference on High Temperature Capillarity (HTC-2015)
Place of Event: Bad Herrenalb, Germany
Start-/End Date: 2015-05-17 - 2015-05-21

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