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  Single shot time stamping of ultrabright radio frequency compressed electron pulses

Gao, M., Jiang, Y., Kassier, G., & Miller, R. J. D. (2013). Single shot time stamping of ultrabright radio frequency compressed electron pulses. Applied Physics Letters, 103(3): 033503. doi:10.1063/1.4813313.

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1.4813313.pdf (Publisher version), 2MB
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© American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
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http://dx.doi.org/10.1063/1.4813313 (Publisher version)
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 Creators:
Gao, Meng1, 2, 3, Author           
Jiang, Yifeng2, 3, Author           
Kassier, Günther2, 3, Author           
Miller, R. J. Dwayne1, 2, 3, Author           
Affiliations:
1Department of Chemistry and Physics, University of Toronto, 80 St. George Street, Toronto, Ontario M5S 3H6, Canada, ou_persistent22              
2Center for Free Electron Laser Science, University of Hamburg, DESY, D-22607 Hamburg, Germany, ou_persistent22              
3Atomically Resolved Structural Dynamics Division, Max Planck Research Department for Structural Dynamics, Department of Physics, University of Hamburg, External Organizations, ou_2173636              

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Free keywords: Cameras; Time measurement; Charge coupled devices; Electron diffraction; Electron sources
 Abstract: We demonstrate a method of time-stamping Radio Frequency compressed electron bunches for Ultrafast Electron Diffraction experiments in the sub-pC regime. We use an in-situ ultra-stable photo-triggered streak camera to directly track the time of arrival of each electron pulse and correct for the timing jitter in the radio frequency synchronization. We show that we can correct for timing jitter down to 30 fs root-mean-square with minimal distortion to the diffraction patterns, and performed a proof-of-principle experiment by measuring the ultrafast electron-phonon coupling dynamics of silicon.

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Language(s): eng - English
 Dates: 2013-05-062013-06-202013-07-152013
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.4813313
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 103 (3) Sequence Number: 033503 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223