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  Full characterization of RF compressed femtosecond electron pulses using ponderomotive scattering

Gao, M., Jean-Ruel, H., Cooney, R. R., Stampe, J., de Jong, M., Harb, M., et al. (2012). Full characterization of RF compressed femtosecond electron pulses using ponderomotive scattering. Optics Express, 20(11), 12048-12058. doi:10.1364/OE.20.012048.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-18CF-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-18DA-7
Genre: Journal Article

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http://dx.doi.org/10.1364/OE.20.012048 (Publisher version)
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 Creators:
Gao, Meng1, Author
Jean-Ruel, Hubert1, Author
Cooney, Ryan R.1, Author
Stampe, Jonathan2, Author
de Jong, Mark2, Author
Harb, Maher1, Author
Sciaini, Germán3, 4, Author              
Moriena, Gustavo1, Author
Miller, R. J. Dwayne1, 3, 4, Author              
Affiliations:
1Institute of Optical Sciences and Department of Physics and Chemistry, University of Toronto, 80 St.George St., Toronto, ON, M5S3H6, Canada, ou_persistent22              
2Canadian Light Source Inc., 101 Perimeter Road, Saskatoon, SK, S7N 0X4, Canada, ou_persistent22              
3Atomically Resolved Structural Dynamics Division, Max Planck Research Department for Structural Dynamics, Department of Physics, University of Hamburg, External Organizations, ou_2173636              
4Centre for Free Electron Laser Science, Notkestraße 85, Hamburg 22607, Germany, ou_persistent22              

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Free keywords: Femtosecond phenomena; Ultrafast measurements
 Abstract: High bunch charge, femtosecond, electron pulses were generated using a 95 kV electron gun with an S-band RF rebunching cavity. Laser ponderomotive scattering in a counter-propagating beam geometry is shown to provide high sensitivity with the prerequisite spatial and temporal resolution to fully characterize, in situ, both the temporal profile of the electron pulses and RF time timing jitter. With the current beam parameters, we determined a temporal Instrument Response Function (IRF) of 430 fs FWHM. The overall performance of our system is illustrated through the high-quality diffraction data obtained for the measurement of the electron-phonon relaxation dynamics for Si (001).

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Language(s): eng - English
 Dates: 2012-04-172012-03-212012-04-172012-05-112012-05-21
 Publication Status: Published in print
 Pages: 11
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1364/OE.20.012048
 Degree: -

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Title: Optics Express
  Abbreviation : Opt Express
Source Genre: Journal
 Creator(s):
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Publ. Info: Washington, DC : Optical Society of America
Pages: - Volume / Issue: 20 (11) Sequence Number: - Start / End Page: 12048 - 12058 Identifier: ISSN: 1094-4087
CoNE: https://pure.mpg.de/cone/journals/resource/954925609918