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  Ellipsometric study of silicon nanocrystal optical constants

Amans, D., Callard, S., Gagnaire, A., Joseph, J., Ledoux, G., & Huisken, F. (2003). Ellipsometric study of silicon nanocrystal optical constants. Journal of Applied Physics, 93(7), 4173-4179.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-16EF-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-16F0-1
Genre: Journal Article

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 Creators:
Amans, D., Author
Callard, S., Author
Gagnaire, A., Author
Joseph, J., Author
Ledoux, G., Author
Huisken, F.1, Author              
Affiliations:
1Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063285              

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Language(s): eng - English
 Dates: 2003-04-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 173768
ISI: 000181729600066
 Degree: -

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Title: Journal of Applied Physics
  Alternative Title : J. Appl. Phys.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 93 (7) Sequence Number: - Start / End Page: 4173 - 4179 Identifier: ISSN: 0021-8979