Ellipsometric study of silicon nanocrystal optical constants

Amans, D.; Callard, S.; Gagnaire, A.; Joseph, J.; Ledoux, G.; Huisken, F.

Local TagsRelease HistoryDetailsSummary

Ellipsometric study of silicon nanocrystal optical constants

Amans, D., Callard, S., Gagnaire, A., Joseph, J., Ledoux, G., & Huisken, F. (2003). Ellipsometric study of silicon nanocrystal optical constants. Journal of Applied Physics, 93(7), 4173-4179.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-16EF-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-16F0-1

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Amans, D., Author
Callard, S., Author
Gagnaire, A., Author
Joseph, J., Author
Ledoux, G., Author
Huisken, F.¹, Author

Affiliations:
1Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063285

Content

show

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2003-04-01

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 173768
ISI: 000181729600066

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Journal of Applied Physics

Alternative Title : J. Appl. Phys.

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 93 (7) Sequence Number: - Start / End Page: 4173 - 4179 Identifier: ISSN: 0021-8979