In situ nanocompression testing in the TEM: Challenges and benefits

Dehm, Gerhard

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In situ nanocompression testing in the TEM: Challenges and benefits

Dehm, G. (2015). In situ nanocompression testing in the TEM: Challenges and benefits. Talk presented at Symposium Advanced Electron Microscopy for Materials Research. Erlangen, Germany. 2015-04-30.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3168-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3169-8

Genre: Talk

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Creators:
Dehm, Gerhard¹, Author

Affiliations:
1Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398

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Language(s): eng - English

Dates: Created: 2015-04

Publication Status: Not specified

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Title: Symposium Advanced Electron Microscopy for Materials Research

Place of Event: Erlangen, Germany

Start-/End Date: 2015-04-30

Invited: Yes

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