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  Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy

Dehm, G., Harzer, T. P., Völker, B., Imrich, P. J., & Zhang, Z. (2015). Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy. Talk presented at Frontiers of Electron Microscopy in Materials Science Meeting (FEMMS 2015). Lake Tahoe, CA, USA. 2015-09-13 - 2015-09-18.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-3170-5 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-5FD2-8
Genre: Talk

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 Creators:
Dehm, Gerhard1, Author              
Harzer, Tristan Philipp1, Author              
Völker, Bernhard2, Author              
Imrich, Peter Julian2, Author              
Zhang, Zaoli3, Author              
Affiliations:
1Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
3Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2015-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Frontiers of Electron Microscopy in Materials Science Meeting (FEMMS 2015)
Place of Event: Lake Tahoe, CA, USA
Start-/End Date: 2015-09-13 - 2015-09-18
Invited: Yes

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