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  Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper

Liu, J., Jian, W., Wang, J. Y., Hofmann, S., & Shimizu, K. (2015). Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper. Applied Surface Science, 331, 140-149. doi:10.1016/j.apsusc.2015.01.065.

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 Creators:
Liu, Jun1, Author
Jian, W.1, Author
Wang, J. Y.1, Author
Hofmann, Siegfried2, Author           
Shimizu, K.3, Author
Affiliations:
1Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063 Guangdong, China, ou_persistent22              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497650              
3University Chemical Laboratory, Keio University, 4-1-1 Hiyoshi, Yokohama 223-8521, Japan, ou_persistent22              

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Free keywords: Emeriti and Others
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 Dates: 2015-01-172015
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.apsusc.2015.01.065
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Title: Applied Surface Science
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 331 Sequence Number: - Start / End Page: 140 - 149 Identifier: ISSN: 0169-4332
CoNE: https://pure.mpg.de/cone/journals/resource/954928576736