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  Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films

Schwarz, T., Choi, P.-P., Cojocaru-Mirédin, O., Mousel, M., Redinger, A., Siebentritt, S., et al. (2015). Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films. Talk presented at E-MRS Spring Meeting 2015. Lille, France. 2015-05-11 - 2015-05-15.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-344D-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-344E-1
Genre: Talk

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 Creators:
Schwarz, Torsten1, Author              
Choi, Pyuck-Pa1, Author              
Cojocaru-Mirédin, Oana1, Author              
Mousel, Marina2, Author              
Redinger, Alex3, Author              
Siebentritt, Susanne2, Author              
Raabe, Dierk4, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              
3Helmholtz-Zentrum Berlin, Department Complex Compound Semiconductor Materials for Photovoltaics, 14109, Berlin, Germany, ou_persistent22              
4Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015
 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
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Title: E-MRS Spring Meeting 2015
Place of Event: Lille, France
Start-/End Date: 2015-05-11 - 2015-05-15

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