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  Sequential process or co-evaporation: Comparison of IVT and admittance data

Weiss, T. P., Redinger, A., Rey, G., Mousel, M., Schwarz, T., Spies, M., et al. (2014). Sequential process or co-evaporation: Comparison of IVT and admittance data. Poster presented at 5th European Kesterite Workshop 2015, Tallinn, Estonia.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-346A-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-346B-0
Genre: Poster

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 Creators:
Weiss, Thomas Paul1, Author              
Redinger, Alex1, Author              
Rey, Germain1, Author              
Mousel, Marina1, Author              
Schwarz, Torsten2, Author              
Spies, Maria2, Author              
Cojocaru-Mirédin, Oana2, Author              
Choi, Pyuck-Pa2, Author              
Siebentritt, Susanne1, Author              
Affiliations:
1University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2014-11
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: 5th European Kesterite Workshop 2015
Place of Event: Tallinn, Estonia
Start-/End Date: 2014-11-13 - 2014-11-14

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