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  Characterization of Mo2BC thin films by transmission electron microscopy methods

Gleich, S., Djaziri, S., Bolvardi, H., Schneider, J. M., & Scheu, C. (2015). Characterization of Mo2BC thin films by transmission electron microscopy methods. Poster presented at 2nd International Workshop on TEM Spectroscopy, Uppsala, Sweden.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6D6A-F
Genre: Poster

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 Creators:
Gleich, Stephan1, Author              
Djaziri, Soundès2, Author              
Bolvardi, Hamid3, Author              
Schneider, Jochen Michael4, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
3Materials Chemistry, RWTH Aachen University, Kopernikusstraße 10, D-52074 Aachen, Germany, ou_persistent22              
4Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2015-05
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 2nd International Workshop on TEM Spectroscopy
Place of Event: Uppsala, Sweden
Start-/End Date: 2015-05-18 - 2015-05-20

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