Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an 
SEM

Zaefferer, Stefan; Kleindiek, S.; Schock, K.; Volbert, B.

Local TagsRelease HistoryDetailsSummary

Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

Zaefferer, S., Kleindiek, S., Schock, K., & Volbert, B. (2013). Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Talk presented at Microscopy and Microanalysis 2013. Indianapolis, IN, USA. 2013-08-04 - 2013-08-08.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-4100-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-4101-2

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Zaefferer, Stefan¹, Author
Kleindiek, S.², Author
Schock, K.², Author
Volbert, B.², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Kleindiek Nanotechnik GmbH, Aspenhaustraße 25, 72770 Reutlingen, Germany, ou_persistent22

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2013-08-05

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: Microscopy and Microanalysis 2013

Place of Event: Indianapolis, IN, USA

Start-/End Date: 2013-08-04 - 2013-08-08

Legal Case

show

Project information

show

Source

show