Accurate and quantitative measurement of plastic strain by SEM-based 
diffraction techniques

Zaefferer, Stefan

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Accurate and quantitative measurement of plastic strain by SEM-based diffraction techniques

Zaefferer, S. (2013). Accurate and quantitative measurement of plastic strain by SEM-based diffraction techniques. Talk presented at RexGG 2013. Sydney, Australia. 2013-05-05 - 2013-05-10.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-41A1-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-41A2-7

Genre: Talk

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Creators:
Zaefferer, Stefan¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2013-05

Publication Status: Not specified

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Title: RexGG 2013

Place of Event: Sydney, Australia

Start-/End Date: 2013-05-05 - 2013-05-10

Invited: Yes

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