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  Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples

Zaefferer, S. (2013). Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples. Talk presented at GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013. Paris, France. 2013-11-26.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-415B-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-415C-5
Genre: Talk

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 Creators:
Zaefferer, Stefan1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2013
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013
Place of Event: Paris, France
Start-/End Date: 2013-11-26
Invited: Yes

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