Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk 
Samples

Zaefferer, Stefan

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Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples

Zaefferer, S. (2013). Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples. Talk presented at GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013. Paris, France. 2013-11-26.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-415B-7 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-415C-5

Genre: Vortrag

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Urheber:
Zaefferer, Stefan¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391