Quantitative analysis of crystal defects by means of EBSD and related methods

Zaefferer, Stefan

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Quantitative analysis of crystal defects by means of EBSD and related methods

Zaefferer, S. (2014). Quantitative analysis of crystal defects by means of EBSD and related methods. Talk presented at Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM. Düsseldorf, Germany. 2014-06-09.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45AB-8 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45AC-6

Genre: Vortrag

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Urheber:
Zaefferer, Stefan¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391