SEM and TEM based orientation microscopy for investigation of recrystallization 
processes

Zaefferer, Stefan

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SEM and TEM based orientation microscopy for investigation of recrystallization processes

Zaefferer, S. (2014). SEM and TEM based orientation microscopy for investigation of recrystallization processes. Talk presented at CNRS summer school on recrystallization. Frejus, France. 2014-09-09.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45BC-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45BD-F

Genre: Talk

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Creators:
Zaefferer, Stefan¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2014

Publication Status: Not specified

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Title: CNRS summer school on recrystallization

Place of Event: Frejus, France

Start-/End Date: 2014-09-09

Invited: Yes

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