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  Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells

Zaefferer, S., & Stechmann, G. (2015). Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Talk presented at Workshop Morphologie und Mikrostruktur dünner Schichten. Dresden, Germany. 2015-03-12.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-45B7-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-45B8-A
Genre: Talk

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 Creators:
Zaefferer, Stefan1, Author              
Stechmann, Guillaume2, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015-03
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Workshop Morphologie und Mikrostruktur dünner Schichten
Place of Event: Dresden, Germany
Start-/End Date: 2015-03-12
Invited: Yes

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