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  Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques

Zaefferer, S., Ram, F., Mandal, S., & Raabe, D. (2015). Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. Talk presented at ICOTOM 17; invited plenary. Dresden, Germany. 2015-08-24 - 2015-08-29.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-45CE-9 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-45CF-7
Genre: Talk

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 Creators:
Zaefferer, Stefan1, Author              
Ram, Farangis1, Author              
Mandal, Suvendu2, Author              
Raabe, Dierk3, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Theory and Simulation of Complex Fluids, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863393              
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015-08
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: ICOTOM 17; invited plenary
Place of Event: Dresden, Germany
Start-/End Date: 2015-08-24 - 2015-08-29
Invited: Yes

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