Dislocations, grain boundaries and strain fields observed on bulk samples: high 
resolution defect analysis by SEM-based diffraction techniques

Zaefferer, Stefan

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Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques

Zaefferer, S. (2015). Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Talk presented at Talk at Universität Bayreuth. Bayreuth, Germany. 2015-04-16.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45F6-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45F7-B

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Creators:
Zaefferer, Stefan¹, Author

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1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2015-04

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Title: Talk at Universität Bayreuth

Place of Event: Bayreuth, Germany

Start-/End Date: 2015-04-16

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