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  Dependence of grain size and microstrains on annealing temperature in Fe/Pt multilayers and L1(0) FePt thin films

Zotov, N., Feydt, J., & Ludwig, A. (2008). Dependence of grain size and microstrains on annealing temperature in Fe/Pt multilayers and L1(0) FePt thin films. Thin Solid Films, 517(2), 531-537.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-6105-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-6106-9
Genre: Journal Article

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Zotov-2008-Dependence of grain.pdf (Any fulltext), 422KB
 
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Zotov, N., Author
Feydt, J.1, Author           
Ludwig, A., Author
Affiliations:
1Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2173680              

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Free keywords: SIZE FE/PT MULTILAYERS multilayers FEPT THIN-FILMS FILMS
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 Dates: 2008
 Publication Status: Issued
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 Identifiers: ISI: ISI:000261693900013
ISSN: 0040-6090
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Title: Thin Solid Films
  Alternative Title : Thin Solid Films
Source Genre: Journal
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Pages: - Volume / Issue: 517 (2) Sequence Number: - Start / End Page: 531 - 537 Identifier: -