English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Structure of PtFe/Fe double-period multilayers investigated by X-ray diffraction, reflectivity, diffuse scattering and TEM

Zotov, N., Feydt, J., Walther, T., & Ludwig, A. (2006). Structure of PtFe/Fe double-period multilayers investigated by X-ray diffraction, reflectivity, diffuse scattering and TEM. Applied Surface Science, 253(1), 128-132.

Item is

Files

show Files
hide Files
:
Zotov-2006-Structure of PtFe_Fe.pdf (Any fulltext), 799KB
 
File Permalink:
-
Name:
Zotov-2006-Structure of PtFe_Fe.pdf
Description:
-
OA-Status:
Visibility:
Private
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
-
License:
-

Locators

show

Creators

show
hide
 Creators:
Zotov, N., Author
Feydt, J.1, Author           
Walther, T., Author
Ludwig, A., Author
Affiliations:
1Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2173680              

Content

show
hide
Free keywords: diffuse scattering Fe-Pt FEPT FILMS MAGNETIC-PROPERTIES multilayers reflectivity ROUGHNESS SUPERLATTICES X-ray diffraction X-RAY-DIFFRACTION X-RAY-SCATTERING
 Abstract: Double-period [(Pt 1.7 nm/Fe 0.9 nm)(5)Fe(tFeA(2))](8) and [(Pt 1.8 nm/Fe 0.6 nM)(5)Fe(t(Fe2))](8) multilayers with different thickness t(Fe2) (between 0.23 and 4.32 nm) of the additional Fe layers, prepared by combinatorial sputter deposition, show differences in the mosaic spread and the vertical interfacial roughness when deposited on native or thermally oxidised Si wafers. Simulations of the wide-angle X-ray scattering intensities revealed the presence of interdiffusion in the (Pt/Fe)(5) bilayers and systematic variations of the grain sizes, perpendicular to the film surface, as well as the rms variations of the two superlattice periods with the total film thickness. A comparison of omega-rocking scans shows an increase of the correlated vertical roughness of the (Pt/Fe)5 multilayers with the total multilayer thickness. (c) 2006 Elsevier B.V. All rights reserved

Details

show
hide
Language(s):
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: ISI:000242317500022
ISSN: 0169-4332
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Surface Science
  Alternative Title : Appl. Surf. Sci.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 253 (1) Sequence Number: - Start / End Page: 128 - 132 Identifier: -